CONDENSATION AND EARLY STAGES OF GOLD GROWTH ON AN MO (110) SURFACE = CONDENSATION ET PREMIERS STADES DE LA CROISSANCE D'OR SUR UNE SURFACE DE MO (110)GRUZZA B; GILLET E.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 68; NO 2; PP. 345-355; BIBL. 13 REF.Article

STRANSKI-KRASTANOV GROWTH MODE OF AU ON MO (110) SURFACE: INVESTIGATION BY AUGER ELECTRON SPECTROSCOPYGILLET E; GRUZZA B.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 97; NO 2-3; PP. 553-563; BIBL. 9 REF.Article

BACKSCATTERING SPECTRA OF MEDIUM ENERGY ELECTRONSGERGELY G; GRUZZA B; MENYHARD et al.1980; ACTA PHYS. ACAD. SCI. HUNG.; ISSN 0001-6705; HUN; DA. 1980; VOL. 48; NO 4; PP. 337-348; BIBL. 21 REF.Article

ETABLISSEMENT PAR SPECTROMETRIE AUGER D'UN PROFIL DE CONCENTRATION DANS UNE INTERFACE EPITAXIQUE: CAS DU COUPLE AU-AGGRUZZA B; GUGLIELMACCI JM; GILLET E et al.1978; THIN SOLID FILMS; NLD; DA. 1978; VOL. 52; NO 1; PP. 103-111; ABS. ENG; BIBL. 9 REF.Article

Some aspects of AES, EELS and EPES application : interpretation of experimental results obtained on InP(100) surfacesGRUZZA, B; PARISET, C.Surface science. 1991, Vol 247, Num 2-3, pp 408-416, issn 0039-6028, 9 p.Conference Paper

Theoretical approach for quantitative analysis of electron spectroscopies: E.P.E.S. and E.E.L.SGRUZZA, B; PARISET, C.Physica scripta (Print). 1989, Vol 39, Num 4, pp 508-512, issn 0031-8949, 5 p.Article

Influence of elastic diffusion of electrons on the Auger current formulation and the backscattering factorGRUZZA, B; PARISET, C.Journal of physics. D, Applied physics (Print). 1989, Vol 22, Num 5, pp 717-719, issn 0022-3727, 3 p.Article

Electrical characterization of the Au/InP(100) and Au/InSb/InP(100) structuresAKKAL, B; BENAMARA, Z; BIDEUX, L et al.Microelectronics journal. 1999, Vol 30, Num 7, pp 673-678, issn 0959-8324Article

Construction d'un analyseur hémisphérique pour spectroscopies électroniques. Elaboration d'un système d'acquisition, expériences spécifiques = Development of a high resolution hemispherical spectrometer for electron spectroscopies. Implementation of the spectra data acquisition system. Specific experiments»Zeze, Dagou; Gruzza, B.1996, s.pThesis

Some practical applications of elastic peak electron spectroscopyJARDIN, C; GERGELY, G; GRUZZA, B et al.Surface and interface analysis. 1992, Vol 19, Num 1-12, pp 5-8, issn 0142-2421Conference Paper

Experiments in MIS structure based on germanium and improvements of the interfacial propertiesBENAMARA, Z; TIZI, S; CHELLALI, M et al.Materials chemistry and physics. 2000, Vol 62, Num 3, pp 273-276, issn 0254-0584Article

Structural and electrical study of <Au/InP(100)> and <Au/InSb/InP(100)> systemsBIDEUX, L; GRUZZA, B; PORTE, A et al.Surface and interface analysis. 1993, Vol 20, Num 9, pp 803-807, issn 0142-2421Article

Contribution of EPES in the study of materialsJARDIN, C; GERGELY, G; GRUZZA, B et al.Materials chemistry and physics. 1992, Vol 32, Num 2, pp 197-201, issn 0254-0584Article

Numerical analysis of forward I-V characteristics of Au/InP interface restructured by antimonyBOUDISSA, A; BENAMARA, Z; AMRANI, M et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2001, Vol 86, Num 3, pp 219-224, issn 0921-5107Article

Effect of ion bombardment at low energy on (100)InP surfaces, studied by Auger electron spectroscopyACHARD, B; GRUZZA, B; PARISET, C et al.Surface science. 1985, Vol 160, Num 2, pp L519-L523, issn 0039-6028Article

Electrical study of the Au/InSb/InP systemAKKAL, B; BENAMARA, Z; BIDEUX, L et al.Semiconductor science and technology. 1999, Vol 14, Num 3, pp 266-270, issn 0268-1242Article

A study by elastically reflected electrons of InP (100) substrates previously ion bombardedGRUZZA, B; ACHARD, B; PARISET, C et al.Journal of physics. D, Applied physics (Print). 1986, Vol 19, Num 1, pp 137-145, issn 0022-3727Article

Propriétés des couches minces de silicium poreux et d'alumine utilisées pour la microélectronique. Etude par spectroscopies électroniques, ellipsométrie laser et caractérisations électriques C(V) = Porous silicon and aluminium oxide thin film properties, used for microelectronical devices. A study using electron spectroscopies, laser ellipsometry and electrical characterizations C(V)Robert, Christine; Gruzza, B.1996, 202 p.Thesis

The AES and EELS study of small rhodium clusters deposited onto alumina substratesTHIAM, M. M; NEHASIL, V; MATOLIN, V et al.Surface science. 2001, Vol 487, Num 1-3, pp 231-242, issn 0039-6028Article

A study of the Au/Pd interface formation using the elastic peak electron spectroscopy methodGRUZZA, B; ROBERT, C; BIDEUX, L et al.Microelectronics journal. 1999, Vol 30, Num 7, pp 625-629, issn 0959-8324Article

Investigation by AES and EELS of ZnO/InP (100) and SnO₂/AgBOUSLAMA, M; GHAMNIA, M; JARDIN, C et al.Vacuum. 1996, Vol 47, Num 11, pp 1353-1359, issn 0042-207XConference Paper

An AES and ELS study of InP(100) surface subjected to argon ion bombardmentJARDIN, C; ROBERT, D; ACHARD, B et al.Surface and interface analysis. 1987, Vol 10, Num 6, pp 301-305, issn 0142-2421Article

Characterization of the M.S structure by the surface photoelectrical voltage methodBENAMARA, Z; AKKAL, B; BOUDISSA, A et al.Microelectronics journal. 1999, Vol 30, Num 7, pp 659-664, issn 0959-8324Article

Structural and electrical characterizations of Ag-InP(100) interfaces stabilized by antimonyMILOUA, F; JARDIN, C; BOUSLAMA, M et al.Materials chemistry and physics. 1993, Vol 33, Num 1-2, pp 85-88, issn 0254-0584Conference Paper

The AES and EELS study of thin alumina films deposited on niobiumKAPSA, R; MATOLIN, V; GRUZZA, B et al.Vacuum. 1998, Vol 50, Num 1-2, pp 233-235, issn 0042-207XConference Paper